Two-dimensional scanning optical system with distortion correction
US4256364A · kind A · utility
31Cited by
2References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 13, 1979 |
| Grant date | Mar 17, 1981 |
| Priority date | — |
| Expiry date | Feb 13, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/0031
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A two-dimensional scanning optical system comprising a deflector capable of two-dimensional deflection of a light beam in two mutually orthogonal directions, an imaging lens system provided with a predetermined distortion characteristic and capable of focusing the light beam deflected by said deflector onto a plane to be scanned, and a light source for introducing said light beam into said deflector in a direction parallel to the optical axis of said imaging lens system, thereby achieving a scanning on said plane with substantially linear scan lines.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.