Selectable wavelength X-ray source, spectrometer and assay method
US4260885A · kind A · utility
Inventor
Key dates
| Filing date | Feb 24, 1978 |
| Grant date | Apr 7, 1981 |
| Priority date | — |
| Expiry date | Feb 24, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for producing X-rays having any selected one of a plurality of specific different wavelength spectra greatly facilitates X-ray fluorescence analysis of samples to detect constituent elements. In the X-ray source, an electron beam is directed to any selectable one of an array of primary targets of different composition. X-rays from the selected primary target may be utilized directly or caused to impinge on any selected one of a plurality of secondary targets, which are also each of differing composition to cause the secondary target to emit a specific X-ray spectrum characteristic of that secondary target. Analysis of the X-ray fluorescence from a sample irradiated by a plurality of different specific selected X-ray spectra enables identification and measurement of particular chemical elements in the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.