Patent · US Expired

Test probe and terminal

US4263547A · kind A · utility

14Cited by
4References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 10, 1978
Grant dateApr 21, 1981
Priority date
Expiry dateMay 10, 1998

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01R11/18
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A test probe for providing a releasable tensioned electrical connection to a selectable part or component of a printed circuit board by either hooking a wire or component lead with the probe end or inserting the probe end into an aperture of a test terminal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.