Multiple source laser scanning inspection system
US4265545A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 27, 1979 |
| Grant date | May 5, 1981 |
| Priority date | — |
| Expiry date | Jul 27, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8901
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A laser scanning flaw direction inspection system is provided for simultaneously scanning a plurality of laser sources across a moving web of material being inspected. The plurality of laser beams are simultaneously scanned utilizing a common scanning apparatus. Laser beam radiation from the plurality of laser sources is collected from the web of material being inspected and detected for generating signals based on the integrity of the radiation applied to the detector from the material being inspected. The plurality of laser sources are preferably of different wave lengths, may have different spot sizes and may be separated by a fixed distance in either the scanned direction or in the direction of web travel. By providing such flexibility in size, positioning and wavelength, and using optical filters to separate the signals related to each of the sources, different types of flaws as well as different information may be generated which would not be possible using a single source system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.