Patent · US Expired

Method and apparatus for testing analog-to-digital and digital-to-analog code converters

US4266292A · kind A · utility

19Cited by
7References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 1978
Grant dateMay 5, 1981
Priority date
Expiry dateNov 20, 1998

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/66
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

An apparatus and method for testing for faults in an analog-to-digital (A/D) section and a digital-to-analog (D/A) section of a code converter in a digital time division, multiplex telecommunications system are disclosed. The A/D section is tested by connecting a digital test pattern via the switching network to the D/A section and monitoring for faults by comparing the resulting output to a reference value. The A/D section is tested by interconnecting the A/D section to be tested between a first previously tested D/A section and a second previously tested D/A section and then connecting the digital test pattern to the first D/A section while monitoring the output of the second D/A section for faults.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.