Method and apparatus for gaging
US4266346A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 5, 1980 |
| Grant date | May 12, 1981 |
| Priority date | — |
| Expiry date | Jun 5, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/312
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are disclosed for gaging the diameter and axis position of circularly shaped part features, such as bores, bosses, etc., consisting of an arrangement for orbiting a probe interfit with the feature to be gaged, the probe adapted to be wobble rotated while in contact with axially spaced locations on the feature. The orbital motion of a probe extension is measured to provide an indication of oversize conditions and/or an out-of-position axis. The wobbling rotation of the probe is achieved by orbital drive of a support plate which is resiliently interconnected with one or more probes to wobble each of the probes, enabling simultaneous gaging of several features. Various special arrangements are disclosed for gaging blind holes, bores of very shallow depth and male features.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.