Method for measuring the thickness of a refractory in a metallurgical apparatus
US4269397A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 7, 1980 |
| Grant date | May 26, 1981 |
| Priority date | — |
| Expiry date | Jul 7, 2000 |
Classification
- Technology area (CPC F)Mechanical Engineering; Lighting; Heating
- CPC primaryF27D21/0021
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
A method for measuring the thickness of a refractory laid-up against the interior surface of the steel shell of a metallurgical apparatus includes placing at least one monitoring device in a critical wear area of the apparatus in a manner such that the free end of the device is at a known distance from the hot face of the refractory and the confined end extends beyond the outer surface of the steel shell. The device is connected to an electronic time-domain reflectometer by electrical connecting means. Timed pulses are generated and impressed in the device by the instrument and reflections of the pulses are received by and are visually displayed on the reflectometer. The length of the device appears on the display as a straight line bounded by two inflections. The straight line is indicative of the thickness of the refractory. The device includes a metallic conductor coaxial with an outer metallic sheath and separated therefrom by a refractory having a desired dielectric constant. The device has a free end and a confined end. The confined end may be contained in a junction box provided with electrical connecting means. Electric insulating packing may be used in the junction box.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.