Measuring system incorporating self-testing probe circuit and method for checking signal levels at test points within the system
US4270178A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 14, 1979 |
| Grant date | May 26, 1981 |
| Priority date | — |
| Expiry date | Nov 14, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a system which measures a parameter of a sample and displays information relating thereto, a circuit including the component elements of the system for testing signal levels at test points within the system and for displaying the test signal levels. Switching means places the system in either a transducing mode for measuring the parameter or in a combined transducing/self-testing mode for simultaneous testing during transducing operation. The testing circuit includes an operator manipulated probe for contacting any of the test points and an analog multiplexer input of the system for multiplexing the probe test signal and the transducing signal. The multiplexed signals are converted to digital form and processed by the system's computer for display. In the combined transducing/self-testing mode, the probe test signal information is outputted to the system display while the transducing output thereto is inhibited. The transducing output information derived during testing is processed and stored by the computer for subsequent display.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.