Patent · US Expired

Method and apparatus for inspection of ceramic parts for defects

US4277977A · kind A · utility

4Cited by

1References

6Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Karl Lubitz · Ottobrunn, DE
Jeffrey Drew · Branford, US
Werner Schuhmann · Munich, DE

Key dates

Filing date	Jun 11, 1979
Grant date	Jul 14, 1981
Priority date	—
Expiry date	Jun 11, 1999

Classification

Technology area (CPC G)Physics
CPC primaryG01N2291/2697
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and apparatus for inspection of ceramic parts for defects utilizes the application of an electrical test voltage to the part to be inspected, and at the same time subjecting the part to acoustic emission analysis. Use of the acoustic emission analysis allows discovery of not only defects which may arise because of the application of the electric current, but also defects or structural damage which are already existant in the part to be tested. An apparatus for carrying out the method on a high-volume basis allows rapid insertion and removal of a part between electrodes and clamps the part in place during testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.