Patent · US Expired

Apparatus and method for measuring scattering of light in particle detection systems

US4286876A · kind A · utility

18Cited by
1References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 2, 1979
Grant dateSep 1, 1981
Priority date
Expiry dateJan 2, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/4716
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In an apparatus in which particles are passed through an optical sensing zone to measure their light scattering characteristics for the purpose of identifying the particles, means and a method are provided for deviating the collected light in accordance with predetermined different paths to a plurality of different photodetecting devices. The deviation is effected simultaneously with collection by optical radiant energy reflecting means. The different photodetecting devices enable the measurement of energy scattered along the particular path which is identified with that device. The paths are established by the combined collecting and deviating means rather than permitted to evolve by the scattering phenomena themselves whereby the photodetecting devices can be located in convenient arrangements and may be conventional in construction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.