Method and apparatus for inspecting transparent objects
US4293219A · kind A · utility
26Cited by
8References
33Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 18, 1978 |
| Grant date | Oct 6, 1981 |
| Priority date | — |
| Expiry date | Aug 18, 1998 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/9054
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Transparent objects having at least a localized region with symmetry of revolution are optically inspected by moving them to an examining station, locally illuminating each of them at the examining station with a plurality of circularly scanned fixed light beams, and detecting light from each by a plurality of successively interrogated fixed detection areas. In a preferred embodiment, the illumination is carried out by circular scanning in successive steps about the object with a plurality of differently-oriented, fixed light beams. At least one detection area is interrogated for each illumination step.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.