Patent · US Expired

Magnet and probe mounting means on a rotating head of magnetic defect testing apparatus

US4297636A · kind A · utility

4Cited by

3References

18Claims

0Family size

Assignee

Institut Dr. Friedrich Forster Prufgeratebau GmbH & Co. KG · DE

Inventors

Hans Link
Ulrich Dreher · Trochtelfingen, DE

Key dates

Filing date	Aug 1, 1979
Grant date	Oct 27, 1981
Priority date	—
Expiry date	Aug 1, 1999

Classification

Technology area (CPC G)Physics
CPC primaryG01N27/82
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The described rotating head effects A.C. field stray flux defect testing process using a rotating magnet yoke for high magnetizing field strength. The unit is compact and replaces a great number of conventional stationary devices in which the test article must be moved along a helical line past the magnet yoke. A speed of the rotating head of 900 revolutions per minute with an effective width of the probe support of 10 cm, achieves a testing speed of approximately 1.5 m/sec. This high testing speed makes the use of A.C. field stray flux testing at high magnetizing field strength possible from the economical point of view.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.