Patent · US Expired

Defect detection

US4298808A · kind A · utility

7Cited by
4References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 8, 1979
Grant dateNov 3, 1981
Priority date
Expiry dateJan 8, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/044
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for indicating a defect in a workpiece, comprises applying a continuously variable signal derived from inspection of the workpiece and including a pulse component representative of the defect to a bank of filters having different frequency transmission characteristics respectively representative of defects of different type so that the filter corresponding most closely to the defect inspected, produces a relatively greater output and provides an indication of defect type.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.