Defect detection
US4298808A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 8, 1979 |
| Grant date | Nov 3, 1981 |
| Priority date | — |
| Expiry date | Jan 8, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/044
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for indicating a defect in a workpiece, comprises applying a continuously variable signal derived from inspection of the workpiece and including a pulse component representative of the defect to a bank of filters having different frequency transmission characteristics respectively representative of defects of different type so that the filter corresponding most closely to the defect inspected, produces a relatively greater output and provides an indication of defect type.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.