Patent · US Expired

Chatter detection in thickness measuring gauges and the like

US4301366A · kind A · utility

7Cited by
5References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 1980
Grant dateNov 17, 1981
Priority date—
Expiry dateJun 6, 2000

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/16
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Process and apparatus for measuring variations in a stream of material, such as thickness in a strip from a mill. A radiation source and detector are positioned at a gauging station. The stream of material moves past the station providing an electrical signal varying as a function of material at the station which signal includes a lower frequency component, a higher frequency cyclical component, and a higher frequency noise component. A circuit for providing a thickness output varying as a function of the lower frequency component of the signal, and a circuit providing an output indicating chatter varying as a function of the higher frequency cyclical component. Digital and analog versions are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.