Patent · US Expired

Digitally controlled multifrequency eddy current test apparatus and method

US4303885A · kind A · utility

92Cited by
7References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 18, 1979
Grant dateDec 1, 1981
Priority date
Expiry dateJun 18, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/9046
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Digitally controlled eddy current test apparatus for detecting flaws, their extent and location. The apparatus provides absolute and differential measurements. The apparatus employs multi-frequencies with the signals from the test coils mixed in a predetermined manner to reduce unwanted signals such as may be introduced by wobble (lift-off) and support plates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.