Patent · US Expired

Process and equipment for the thermal analysis of materials

US4304118A · kind A · utility

6Cited by
6References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 5, 1979
Grant dateDec 8, 1981
Priority date
Expiry dateNov 5, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N5/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and an apparatus for the differential thermal analysis of materials includes heating a first sample to be investigated and a reference sample by radiation heat transfer from respective separated radiation sources, controlling both sources according to a predetermined temperature program for the samples, interposing an element that partly transmits radiation between each of the samples and their associated sources, sensing the temperature difference between the elements, controlling one of the radiation sources in response to the temperature difference to equalize the temperature of the elements and measuring the temperature difference between the samples during the temperature program.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.