Method of measuring the amount of substance associated with a material in the presence of a contaminant
US4306151A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 27, 1979 |
| Grant date | Dec 15, 1981 |
| Priority date | — |
| Expiry date | Apr 27, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of measuring the amount of substance associated with a material in the presence of a contaminant comprises choosing a first band of radiation which lies outside the absorption band of the substance but within the absorption band of the contaminant. The first band is directed at the material; a first detector is positioned to receive the radiation after impinging the material. The first detector converts the radiation received into a first electrical signal. A second band of radiation, which is chosen to lie within the absorption band of the substance, is also within an absorption band of the contaminant. The second band is directed at the material; a second detector is positioned to receive the radiation after impinging the material. The second detector produces a second electrical signal in response to the radiation received. The second electrical signal is subtracted from the first electrical signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.