Patent · US Expired

Reactive sputter etching apparatus

US4309267A · kind A · utility

26Cited by
4References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 21, 1980
Grant dateJan 5, 1982
Priority date
Expiry dateJul 21, 2000

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/34
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An rf sputter etch or reactive sputter etch apparatus which can be used for etching substrates at oblique angles utilizes a cathode formed from a metal grid and an equipotential enclosure. The substrate is supported in the enclosure either parallel to or at an oblique angle to the surface of the grid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.