Device for extracting a density as one of pattern features for each feature point of a streaked pattern
US4310827A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 2, 1980 |
| Grant date | Jan 12, 1982 |
| Priority date | — |
| Expiry date | Apr 2, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07C9/37
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In addition to positions and directions of feature points of a streaked pattern, such as minutiae of a fingerprint on a background, a plurality of novel counts and a density are automatically extracted for each feature point selected as a reference feature point. The density is determined in connection with adjacent feature points that are present in a predetermined neighborhood of the reference feature point. Each count is decided by the number of streaks or ridges intervening between the reference feature point and a related feature point that is nearest to the reference feature point among the feature points in a predetermined sector of the neighborhood.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.