Recirculating loop memory array fault locator
US4313199A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 26, 1980 |
| Grant date | Jan 26, 1982 |
| Priority date | — |
| Expiry date | Jun 26, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/003
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Apparatus is disclosed for quickly testing memory arrays of multiple recirculating loop memory elements and for locating faulty elements, if any, within designated subdivisions of said array. All loops are loaded with identical test bits. The loaded data is verified and faulty elements, if any, are located by means of a plurality of comparison AND gates. Each gate is connected to the output of a respective subdivision of the array elements and produces a first output signal when all such outputs are identical (on a serial bit-by-bit basis) and produces a second output signal when all said outputs are not identical. The output signals from the respective comparison AND gates are sensed in serial succession to locate the array subdivision containing any faulty elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.