Patent · US Expired

Combinable apparatus for examination of the eye

US4315672A · kind A · utility

14Cited by
1References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 9, 1979
Grant dateFeb 16, 1982
Priority date
Expiry dateJul 9, 1999

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B3/107
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

The invention contemplates eye-examination apparatus wherein modular-component construction enables a base with binocular-microscope viewing structure to selectively serve multiple-instrument functions, one of which is specifically an ophthalmometer. In the form described, the ophthalmometer component is a module which, when selected for use with the base module, provides a direct internally developed read-out of reflected-mire displacement in one of the two optical systems of binocular viewing and which provides via the other binocular optical system a concurrent display of the two reflected-mire images in the course of displacement adjustment; in the other selected employment of the base module, the instrument is a slit-lamp microscope. The ophthalmometer axis coincides with the central axis of symmetry of the slit-lamp microscope, so that no adjustment of the base module is needed in relation to a particular eye to make successive use of the same viewing structure in a slit-lamp mode and in an ophthalmometer mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.