Laser EXAFS
US4317994A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 20, 1979 |
| Grant date | Mar 2, 1982 |
| Priority date | — |
| Expiry date | Dec 20, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/085
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus (10) for obtaining EXAFS data of a material (11). A lens (12) directs a pulse of radiant energy (13) from a laser (14) onto a metal target (15) to produce X-rays (16) of a selected spectrum and intensity at the target (15). A baffle (17) directs X-rays (16) from the target (15) onto a spectral dispersive monochromator (18) which directs the spectrally resolved X-rays (16R) therefrom onto a photographic film 20. A film of material (11) is located in the path (22) of only a portion (16L) of the X-rays (16) throughout a selected spectral band, and the resolved X-rays (16R) directed onto the photographic film (20) form two separate images thereon comprising a reference spectrum (26R) representative of a portion of the X-rays (16U) throughout the selected band that was not affected by the film of material (11) and an absorption spectrum (26A) representative of a portion of the X-rays (16L) throughout the selected band that was modified by transmission through the film of material (11). The laser pulse (13) typically has a width of less than about 10 nanoseconds, and the material (11) may be in a highly transient state.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.