Patent · US Expired

Retro-etch process for integrated circuits

US4318759A · kind A · utility

10Cited by
7References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 21, 1980
Grant dateMar 9, 1982
Priority date
Expiry dateJul 21, 2000

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/947
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of electrically isolating a plurality of semiconductor integrated circuit components and for forming gate elements for silicon gate transistors is disclosed whereby extremely narrow line widths can be formed which heretofore have been unattainable by practicing conventional photolithography.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.