Method and improved apparatus for obtaining temperature-corrected readings of ion levels and readings of solution temperature
US4321544A · kind A · utility
6Cited by
5References
17Claims
0Family size
Inventor
Key dates
| Filing date | Feb 19, 1980 |
| Grant date | Mar 23, 1982 |
| Priority date | — |
| Expiry date | Feb 19, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/4166
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved temperature-compensated ion measurement method and apparatus for use therein. The method comprises placing a probe in a solution whose ion level (for example, pH) is to be measured and measuring the A.C. resistance of the probe in a manner that does not adversely affect the simultaneous measurement of the probe's D.C. potential, and then driving from these two measurements the ion level of the solution corrected for its temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.