Patent · US Expired

Temperature compensation system for Hall effect element

US4327416A · kind A · utility

33Cited by
7References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 16, 1980
Grant dateApr 27, 1982
Priority date
Expiry dateApr 16, 2000

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/07
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a solid state current, power or energy meter having a Hall element magnetically coupled to line current, a system for compensating the Hall voltage for its dependence on temperature comprises a read only memory (ROM) containing experimentally obtained temperature compensation data. The temperature of the Hall element is measured by a thermistor to develop a temperature dependent voltage. In one embodiment, the Hall element voltage and temperature dependent voltage are digitalized and supplied to address the ROM to generate a temperature compensated Hall voltage. In a second embodiment, the ROM is addressed by only the temperature dependent voltage to generate a correction voltage that is added to the Hall element voltage for temperature compensation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.