Patent · US Expired

Very large scale integrated circuit

US4329640A · kind A · utility

14Cited by
3References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 1979
Grant dateMay 11, 1982
Priority date
Expiry dateMay 24, 1999

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3185
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A monolithically very large scale integrated circuit (VLSI) having any arbitrarily given structure and an internal test circuit only requiring one, two or three additional outer terminals wherein the test circuit is integrated therein. In one embodiment the test circuit contains a counter and a combinational circuit interconnected with the counter reading outputs thereof as well as selection switches associated with test points and where the first of the additional terminals is connected to the counting input of the counter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.