Electrically alterable read only memory semiconductor device made by low pressure chemical vapor deposition process
US4330930A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 1980 |
| Grant date | May 25, 1982 |
| Priority date | — |
| Expiry date | Feb 12, 2000 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/69
Abstract
An electrically alterable read only memory (EAROM) having a tunneling layer of an insulating material such as silicon dioxide which is grown on the substrate by thermal oxidation carried out at low pressure and a layer of silicon nitride laid down on the tunneling layer by a low-pressure chemical vapor deposition, the interface of the two layers forming a charge storage area with the EAROM having improved read/write switching capability and quality, and improved reliability and memory retentivity characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.