Patent · US Expired

Method of making an RF admittance measuring probe and product thereof

US4332167A · kind A · utility

8Cited by
14References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 21, 1979
Grant dateJun 1, 1982
Priority date—
Expiry dateMar 21, 1999

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S264/78
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An RF probe and method for making same including laminating sheets of thermoplastic insulation to both sides of a layer of wire screen which is evacuated and pressure thereafter applied by fluid pressure acting on a diaphragm pressing member.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.