Interferometric system
US4347000A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Dec 26, 1979 |
| Grant date | Aug 31, 1982 |
| Priority date | — |
| Expiry date | Dec 26, 1999 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/02084
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interferometric system for testing a lens comprises a source of light and a beam splitter in the path of the light divides the light into first and second beams. A device is provided for holding the lens to be tested in the first beam. A reflector is disposed in the path of the first beam beyond the lens for reflecting the first beam to the beam splitter. A movable reflector is provided in the path of the second beam for reflecting the second beam to the beam splitter to form a single recombined beam. The movable reflector is displaceable in translation along the axis of the beam it reflects and in rotation about an axis or orthogonal axes in the plane of the movable reflector and perpendicular to the beam axis. The entire recombined beam impinges on a photoelectric detector which, in response thereto, generates an electrical signal representing the complex point spread function of the lens being tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.