Patent · US Expired

Neel wall segment detection in cross-tie memory systems

US4347583A · kind A · utility

1Cited by
2References
5Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 18, 1980
Grant dateAug 31, 1982
Priority date
Expiry dateJun 18, 2000

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C19/0866
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and device for detecting Neel wall segments in a cross-tie memory system involves applying a magnetic field to the Neel wall segments of a given polarity so that these Neel wall segments expand into a transverse domain. The transverse domain is then sensed with a magnetoresistive detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.