Speckle pattern interferometer
US4352565A · kind A · utility
Inventors
Key dates
| Filing date | Jan 12, 1981 |
| Grant date | Oct 5, 1982 |
| Priority date | — |
| Expiry date | Jan 12, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/02094
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A speckle pattern interferometer for use in the non-destructive testing of structures employs a laser beam which is split into reference and object beams having substantially the same optical path lengths to the screen of a sensor, such as a vidicon, where the two beams are combined. The object beam is reflected from the surface of an object under investigation, this object being vibrated periodically. The reference beam passes through an optical fiber cut to the proper length to equalize the length of the reference beam path with that of the object beam. The output of the vidicon is fed to an electronic processor where the signals are appropriately processed to provide a speckle pattern display on a monitor viewing screen.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.