Patent · US Expired

Apparatus for process analysis

US4357300A · kind A · utility

3Cited by

3References

4Claims

0Family size

Assignees

BAYER HEALTHCARE LLC · DE
Compur-Electronic GmbH · DE

Inventors

Eberhard Nicklaus · Bergheim, DE
Heinz Warncke · Cologne, DE
Wilhelm Pross
Wolfgang Hartl · Munich, DE

Key dates

Filing date	May 29, 1980
Grant date	Nov 2, 1982
Priority date	—
Expiry date	May 29, 2000

Classification

Technology area (CPC G)Physics
CPC primaryG01N35/00693
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an apparatus for process analysis, a test substance is removed from the process stream by a probe and fed to an analysis instrument with a measured value display. Upstream of the analysis instrument, the test gas is conveyed through condensers. A monitoring unit is coupled to the analysis instruments and the processing chain without influencing the flow of data from the analysis instrument to the measured value display. The monitoring unit receives information about the entire apparatus via status sensors which are incorporated into the processing chain and into the analysis instrument. Depending on this information, the monitoring unit can intervene via solenoid valves, switches and motor potentiometers into the apparatus and alter its operation. The condition of the apparatus can also be displayed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.