Patent · US Expired

Microwave method for measuring the relative moisture content of an object

US4361801A · kind A · utility

30Cited by

2References

7Claims

0Family size

Assignee

U.S. Philips Corporation · US

Inventors

Wolfgang Meyer · Erlangen, DE
Wolfram Schilz · Norderstedt, DE

Key dates

Filing date	Jul 14, 1980
Grant date	Nov 30, 1982
Priority date	—
Expiry date	Jul 14, 2000

Classification

Technology area (CPC G)Physics
CPC primaryG01N22/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The moisture content of an object is determined by placing the object in a field produced by a microwave applicator and measuring the dielectric properties of the applicator. The measured properties are used to derive the moisture content from known dielectric properties for the applicator without the object present, and from known moisture/dielectric properties for the specific material of the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.