Time interval measurement arrangement
US4362394A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jul 28, 1981 |
| Grant date | Dec 7, 1982 |
| Priority date | — |
| Expiry date | Jul 28, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG04F10/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A time interval measurement arrangement allows extremely accurate measurements to be performed on a complex repetitively recurring waveform. The need arises to perform such measurements in connection with television waveform calibration instruments. The time interval measurement is performed in terms of an accurate amplitude measurement which identifies the required instant in time on the waveform under test. An amplitude sampling circuit is used which repetitively samples the signal at selected points so as to progressively alter in incremental steps a sample value until it is brought into agreement with the actual value of the signal. This process removes the effect of jitter and noise from the measurement process and enables great accuracy to be achieved.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.