Statically balanced inspection probe assembly
US4364179A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 31, 1980 |
| Grant date | Dec 21, 1982 |
| Priority date | — |
| Expiry date | Oct 31, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe assembly for use with a three axis inspection machine that is intended to measure deviation of work piece surfaces in three axes includes apparatus for statically balancing the probe in the X and Y axes and also for restricting motion of the probe to a single axis or to any combination of the axes. The probe assembly includes a universal joint arrangement on the distal end of the measuring arm of the machine permitting deflection in the X and Y axes and also includes means for permitting travel in the Z axis. The various components are interconnected so as to make it possible to selectively preclude movement in either the X, Y or Z axis or to permit movement in one, two or all three axes, as desired. Furthermore, easy release friction means are employed to permit the probe stylus holder to slide along its longitudinal axis to prevent inadvertent damage to the actual probe assembly itself. The assembly is also designed to measure deviation of the probe, either by a printout or on an analog meter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.