Temperature pattern measuring device
US4365307A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 25, 1981 |
| Grant date | Dec 21, 1982 |
| Priority date | — |
| Expiry date | Feb 25, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A temperature pattern measuring device for obtaining the surface temperature distribution of an object. The device receives an image of the measured object and two different wavelength components of light emitted from the object. The device performs a two color temperature process for each minute area within a visual field of the image pickup, detecting the temperature at a portion on the surface of the corresponding measured object, thereby obtaining the temperature pattern thereof. The above minute areas can be set by an electrical method using photoelectric conversion means. Also, a supervision unit for the weld zone at an electrically seamed pipe, may employ the temperature pattern measuring unit of the present invention, the supervision unit producing a composite display of the form of the weld zone and the temperature pattern thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.