Process and apparatus for the surface analysis of flexible materials
US4367951A · kind A · utility
4Cited by
4References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 8, 1980 |
| Grant date | Jan 11, 1983 |
| Priority date | — |
| Expiry date | Dec 8, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG07D7/181
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
The surface character of flexible materials is examined by means of interference fields which are formed by reflection of light beams from a reflecting reference surface and from the adjoining surface to be examined, and subsequent super-position of the partial beams thereby formed. The interference field which corresponds to the surface profile standing out from the reference surface is utilized to determine the length and height of the surface profile, with the aid of the interference band spacings and the wavelength of the incident light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.