Patent · US Expired

Test device for the detection and analysis of material faults

US4370889A · kind A · utility

11Cited by
2References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 10, 1980
Grant dateFeb 1, 1983
Priority date
Expiry dateSep 10, 2000

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E30/30
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Test equipment for the detection and analysis of material faults in a test piece, including a test head, an electrical remotely controlled manipulator for moving the test head in at least two degrees of freedom, a device connected to the test head for supplying the test head and evaluating signals thereof, a display connected to the test head for measuring test results thereof, a device for providing the manipulator with a testing program for automatically following a predetermined path at the surface of the test piece, an electronic transmission system connected to the manipulator, a device connected to the electronic transmission system for simulating the test piece, and a remote controlled hand-operated guide element disposed adjacent to the display in the simulating means for controlling the test head in correspondence to manual operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.