X-Ray detector of semiconductor type
US4382183A · kind A · utility
5Cited by
2References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 8, 1981 |
| Grant date | May 3, 1983 |
| Priority date | — |
| Expiry date | Jan 8, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F30/29
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An X-ray detector of semiconductor type in which reflected electrons emitted from a sample are diverted to another direction by the action of a magnetic field provided across a passage for X-rays from a sample to an X-ray detecting element of semiconductor type, and an absorbent for absorbing reflected electrons is arranged ahead of the magnetic field in the path of the diverted reflected electrons, so as to prevent the reflected electrons from being incident on the X-ray detecting element, thereby improving the S/N ratio of the detecting element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.