Patent · US Expired

Graded bandgap photodetector

US4383269A · kind A · utility

30Cited by
2References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 19, 1980
Grant dateMay 10, 1983
Priority date
Expiry dateSep 19, 2000

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F30/2255

Abstract

The invention is a reduced noise avalanche photodetector. The detector comprises a p-type region, an n-type region, and a graded bandgap avalanche region situated between the p- and n-type regions. Radiation to be detected is absorbed in one of the p-type and n-type regions and charge carriers are generated in response thereto. When the device is under a reverse bias, one type of photogenerated charge carrier is injected by diffusion into the graded bandgap region and initiates an avalanche discharge therein. The carrier type initiating the discharge moves toward a region of decreasing bandgap energy, while the other type of charge carrier moves toward a region of increasing bandgap energy, thus resulting in a large difference between the ionization coefficients of the two types of charge carriers. The differing "quasi-electric" fields experienced by the two types of charge carriers also contributes to the difference between the ionization coefficients of the electrons and holes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.