Method and apparatus for measuring the spacing between the opposed surfaces of separated elements
US4387339A · kind A · utility
20Cited by
2References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 2, 1980 |
| Grant date | Jun 7, 1983 |
| Priority date | — |
| Expiry date | Jun 2, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/2013
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and device for measuring of the spacing between two opposite surfaces (10, 12) of magnetically conductive material according to the reluctance method by means of a position indicator (14). An indicator with two coils (22, 24) is used, which coils are supplied with current so as to work in opposite directions and the currents are controlled so as to keep resultant magnetic flux through a DC field meter (30) positioned between the coils all the time equal to zero. The measuring result is obtained by measuring the difference between the currents fed to the coils (22, 24).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.