Patent · US Expired

Test apparatus for determining resistance to light and weather influences

US4391522A · kind A · utility

18Cited by

7References

5Claims

0Family size

Assignee

Original Hanau Heraeus GmbH · DE

Inventors

Helmut Schmid · Freudenstadt, DE
Martin Bock · Berlin, DE
Gunther Kampf

Key dates

Filing date	Oct 3, 1980
Grant date	Jul 5, 1983
Priority date	—
Expiry date	Oct 3, 2000

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/1241
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

To provide for more reliable determination of resistance of sample surfaces to light and weather influences, test apparatus is equipped with a radiation-measuring device. A portion of radiation used for testing is guided to the measuring device, by quartz guides, spectrally dispersed, and measured as to intensity and/or dosage in one or several pre-selected spectral regions. Tests may use natural or artificial radiation, and a measuring device may be stationary or movable relative to a radiation source.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.