Apparatus for measuring vapor density, gas temperature, and saturation ratio
US4394575A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 30, 1980 |
| Grant date | Jul 19, 1983 |
| Priority date | — |
| Expiry date | Jun 30, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/602
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring vapor density and saturation ratio of individual chemical species in multi-component, multi-phase systems includes means to permit measurement in supersaturated vapor and in the presence of liquid, solid and dispersed aerosol phases of the sampled gas component and of other chemical species. Active narrowband differential measurements of broad band radiation passed through the sampled environment and then isolated to a plurality of narrow wavelength bands whose wavelength is related to the gaseous absorption spectra of the sampled species permit the measurement of vapor density of individual chemical components. A concurrent passive radiometric measurement of gas temperature in a strong absorption band of a relatively constant gaseous component enables the conversion of component vapor density to component saturation ratio even in the presence of component or system supersaturation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.