Magnetostatic wave delay line having improved group delay linearity
US4400669A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 25, 1981 |
| Grant date | Aug 23, 1983 |
| Priority date | — |
| Expiry date | Sep 25, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03H2/001
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The linearity of group delay versus frequency in magnetostatic wave delay lines is improved by a linear variation of one of three discrete parameters in the region between the two delay line transducers. The parameter variation is applied to magnetostatic wave delay lines that have a ground plane, a magnetic garnet crystal film substrate that is spaced from the ground plane and has transmitting and receiving transducers engaged to it, and a magnetic bias field. The discrete parameters varied are the magnetic bias field; the distance of the substrate from the ground plane; and the thickness of the substrate. Appropriate linear variations of any one of the these parameters provides improved linearity of group delay versus frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.