Method and apparatus for the automatic diagnosis of system malfunctions
US4402054A · kind A · utility
77Cited by
7References
8Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 15, 1980 |
| Grant date | Aug 30, 1983 |
| Priority date | — |
| Expiry date | Oct 15, 2000 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06G7/66
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Diagnostic apparatus for monitoring a system subject to malfunctions. Estimates are obtained relating normal system operation to operating variables. Estimates are additionally obtained relating specific malfunctions to specific variables. The variables are combined in accordance with predetermined functions to get an indication of a particular malfunction. This indication is modified by a factor related to the normal operation of the system to yield a probability of the occurrence of the malfunction, and which probability is limited to a value less than 100%.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.