Patent · US Expired

High contrast flatness interferometer

US4406543A · kind A · utility

2Cited by
1References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 1981
Grant dateSep 27, 1983
Priority date
Expiry dateJul 17, 2001

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/306
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is an interferometer having an optical flat having a coated reference surface of aluminum whose thickness is in the range of 100-500 A (preferably about 300 A) covered with a coating of silicon dioxide of a thickness in the range of 1,000-10,000 A (preferably about 3,000 A). Such a coating on an optical flat when in engagement with a surface of an object to be tested greatly enhances the contrast of the interference fringes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.