Apparatus for inspecting average size of fundamental patterns
US4408883A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 4, 1981 |
| Grant date | Oct 11, 1983 |
| Priority date | — |
| Expiry date | Mar 4, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for determining the average size of fundamental patterns contained in a given region of an object to be inspected, which includes Fourier transform means for producing output data corresponding to a Fourier transform pattern image of the given region of the object, and processor means for processing the output data to provide the actual pattern size information. The Fourier transform means includes a Fourier converter for providing the output data corresponding to Fourier transform patterns. The processor means includes an extractor coupled to the Fourier transform means for extracting a single magnitude data (I.sub.n) representing the order n of spatial frequency component (e.g. 200) from the output data, the magnitude of the order n component changing with variation (e.g. .DELTA.a.sub.H) of the size of patterns; and a data processor coupled to the extractor for determining the average size of patterns in the given region according to the single magnitude (I.sub.n) and providing the actual pattern size information indicating the averge size of the patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.