Method and means for diagnostic testing of CCD memories
US4409676A · kind A · utility
5Cited by
2References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 19, 1981 |
| Grant date | Oct 11, 1983 |
| Priority date | — |
| Expiry date | Feb 19, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Diagnostic testing of a charge coupled device is facilitated by interconnecting the reference node of the sense amplifier for each data block in the CCD device with a probe contact on the device, thereby eliminating the need for applying a microprobe to the sensitive reference node. Reference voltages under different operating conditions can be evaluated by measuring the device generated reference voltage or by applying variable reference voltages through the probe contact to the reference node.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.