Optical displacement and contour measuring
US4411528A · kind A · utility
16Cited by
9References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 19, 1981 |
| Grant date | Oct 25, 1983 |
| Priority date | — |
| Expiry date | Jan 19, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for optical measurement of the displacement and the obliquity of a test surface relative to an imaginary reference surface. An inwardly converging ring of light is projected onto a test surface. An optical system conveys an image of this ring to a photo diode array where its circumference is compared to an imaginary image of the ring projected onto an imaginary reference surface. This comparison yields the displacement of the test surface through 360.degree. of rotation, which is converted into the shape or contour of the test surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.