Integrated circuit including test portion and method for making
US4413271A · kind A · utility
23Cited by
8References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 30, 1981 |
| Grant date | Nov 1, 1983 |
| Priority date | — |
| Expiry date | Mar 30, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D84/63
Abstract
A test circuit, including a vertical NPN, a lateral PNP and a vertical PNP transistor plus a diffused resistor and a thin film resistor, is formed by altogether simultaneous steps with corresponding components of each principal integrated circuit. Four dedicated test pads in each integrated circuit lead to all bases, collectors, emitters and resistor extremities so as to permit substantially unshunted measurements of all basic transistor and resistor electrical parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.